Nearfield Instruments Secures $135 Million in Series C Funding for Revolutionary Atom-Scale Metrology Systems

We are thrilled to announce that Nearfield Instruments (NFI) has successfully raised $135 million in our latest funding round, a significant milestone that will propel our mission to revolutionize metrology in the semiconductor industry. Specializing in high throughput scanning probe microscopy systems, NFI combines cutting-edge science and advanced technology to deliver unprecedented atomic-scale resolution at industry-level throughput. Our innovative metrology machines are designed to empower the world’s leading chipmakers, enabling them to enhance their production yields and effectively increase the functionality of microchips. This infusion of capital will be pivotal in accelerating our research and development initiatives, allowing us to expand our product offerings and further optimize our systems to meet the rapidly evolving demands of the consumer electronics market. With this funding, we are committed to advancing the frontier of metrology, ensuring that our customers can produce smaller, more powerful devices that enhance everyday life. As we move forward, we remain steadfast in our vision of bringing together the brightest minds in science and technology to drive transformative progress in the semiconductor landscape. We extend our deepest gratitude to our investors for their confidence in NFI’s vision and capabilities. Together, we are poised to shape the future of innovation in microchip production, making a lasting impact on industries worldwide.